Characterization of CRYO ASIC for charge readout in the nEXO experiment
Z. Li🇺🇸 · M. Yu🇺🇸 · E. Angelico🇺🇸 · A. Atencio🇺🇸 · A. Gupta🇺🇸 · P. Knauss🇺🇸 · A. Pena-Perez🇺🇸 · B. G. Lenardo🇺🇸 · P. Acharya🇺🇸 · A. Amy🇫🇷 · A. Anker🇺🇸 · I. J. Arnquist🇺🇸 and 132 other authors
nEXO is a proposed next-generation experiment searching for the neutrinoless double beta decay of Xe using a tonne-scale liquid xenon (LXe) time projection chamber (TPC). To image the ionization signals from events in the liquid xenon, the detector will employ metallized fused-silica charge collection tiles instrumented with cryogenic application-specific integrated circuits (ASICs), referred to as CRYO ASIC, which are designed to operate directly in LXe to minimize input capacitance and pick-up noise. Here we present the performance of the CRYO ASIC mounted on an auxiliary printed circuit board and evaluated both in a cryogenic environmental chamber and in a dedicated LXe test stand. We demonstrate that the ASICs achieve the desired performance at liquid xenon temperatures, showing a gain stability better than 0.2% over 24-hour operation and reliable in-situ calibration using an on-chip pulser. In the LXe test stand, we show that boiling caused by the chip heat dissipation can be mitigated by operating the system above ~0.1 MPa. The in-LXe noise measured agrees with simulation, which indicates it the design requirement can be satisfied. These results establish CRYO ASIC as a viable low-noise in-LXe charge readout solution for nEXO.