High-precision mass measurement of Si and a refined determination of the process at the waiting point
D. Puentes🇺🇸 · Z. Meisel🇺🇸 · G. Bollen🇺🇸 · A. Hamaker🇺🇸 · C. Langer🇩🇪 · E. Leistenschneider🇺🇸 · C. Nicoloff🇺🇸 · W.-J. Ong🇺🇸 · M. Redshaw🇺🇸 · R. Ringle🇺🇸 · C. S. Sumithrarachchi🇺🇸 · J. Surbrook🇺🇸 · A. A. Valverde🇨🇦 · I. T. Yandow🇺🇸
We report a high precision mass measurement of , performed with the LEBIT facility at the National Superconducting Cyclotron Laboratory. The atomic mass excess, (37) keV, is a factor of 5 more precise than previous results. This substantially reduces the uncertainty of the reaction rate, which is a key part of the rapid proton capture () process powering Type I X-ray bursts. The updated rate constrains the onset temperature of the process at the waiting-point to a precision of 9%.