On Determining Dead Layer and Detector Thicknesses for a Position-Sensitive Silicon Detector
J. Manfredi🇺🇸 · Jenny Lee🇨🇳 · W.G. Lynch🇺🇸 · C.Y. Niu🇺🇸 · M.B. Tsang🇺🇸 · C. Anderson🇺🇸 · J. Barney🇺🇸 · K.W. Brown🇺🇸 · Z. Chajecki🇺🇸 · K.P. Chan🇺🇸 · G. Chen🇺🇸 · J. Estee🇺🇸 and 10 other authors
In this work, two particular properties of the position-sensitive, thick silicon detectors (known as the "E" detectors) in the High Resolution Array (HiRA) are investigated: the thickness of the dead layer on the front of the detector, and the overall thickness of the detector itself. The dead layer thickness for each E detector in HiRA is extracted using a measurement of alpha particles emitted from a Pb pin source placed close to the detector surface. This procedure also allows for energy calibrations of the E detectors, which are otherwise inaccessible for alpha source calibration as each one is sandwiched between two other detectors. The E detector thickness is obtained from a combination of elastically scattered protons and an energy-loss calculation method. Results from these analyses agree with values provided by the manufacturer.